-
1
-
-
0028699696
-
A Simple Algorithm for Predicting Proton SEU Rates in Space Compared to the Rates Measured on the CRRES Satellite
-
R.A. Reed, P.J. McNulty, W.J. Beauvais, W.J. Abdel-Kader, E.G. Stassinopoulos, and J.C.L, BarthA Simple Algorithm for Predicting Proton SEU Rates in Space Compared to the Rates Measured on the CRRES SatelliteIEEE Trans. Nucl. Sci., vül. NS-41,pp. 2389-2394,1994.
-
IEEE Trans. Nucl. Sci., Vül. NS-41,pp. 2389-2394,1994.
-
-
Reed, R.A.1
McNulty, P.J.2
Beauvais, W.J.3
Abdel-Kader, W.J.4
Stassinopoulos, E.G.5
Barth6
-
2
-
-
0032313960
-
Extension of the Burst Generation Rate Method for Wider Application to Proton/Neutron-Induced Single Event Effects
-
R. NormandExtension of the Burst Generation Rate Method for Wider Application to Proton/Neutron-Induced Single Event EffectsIEEE Irani. Nucl. Sci., vol. NS-45,pp. 2904-2914,1998.
-
IEEE Irani. Nucl. Sci., Vol. NS-45,pp. 2904-2914,1998.
-
-
Normand, R.1
-
3
-
-
0030199623
-
Modeling of Proton Induced SEUs
-
A, Akkerman, J. Barak, J. Levinson, and Y. LifshitzModeling of Proton Induced SEUsRadial. Phys. Chem.,vol. 48,pp. 11-22,1996.
-
Radial. Phys. Chem.,vol. 48,pp. 11-22,1996.
-
-
Akkerman1
Barak, J.2
Levinson, J.3
Lifshitz, Y.4
-
4
-
-
0030361817
-
An Empirical Model for Predicting Proton Induced Upset
-
P. Calvel, C. Barillot, P. Lamothe, R, Ecoffet, S. Duzellier, and D. FalguèreAn Empirical Model for Predicting Proton Induced UpsetIEEE Trans. Nucl. Set., vol. NS-43,pp. 2827-2832,1996.
-
IEEE Trans. Nucl. Set., Vol. NS-43,pp. 2827-2832,1996.
-
-
Calvel, P.1
Barillot, C.2
Lamothe, P.3
Ecoffet4
Duzellier, S.5
Falguère, D.6
-
6
-
-
0030173120
-
A Simple Model for Calculating Proton Induced SEU
-
J. Barak, J. Levinson, A. Akkenrmn, Y. Lifshitz, and M. VictoriaA Simple Model for Calculating Proton Induced SEUIEEE Trans. Nucl. Sci., vol, NS-43, pp,979-984,1996,
-
IEEE Trans. Nucl. Sci., Vol, NS-43, Pp,979-984,1996
-
-
Barak, J.1
Levinson, J.2
Akkenrmn, A.3
Lifshitz, Y.4
Victoria, M.5
-
7
-
-
0030166446
-
A New Approach to the Analysis of SEU and SEL Data to Obtain the Sensitive Volume Thickness
-
J. Barak, L. Levinson, A. Akkcrman, M. Hass, M. Victoria, A. Zentner, D. David, O. Even, and Y. LifshitzA New Approach to the Analysis of SEU and SEL Data to Obtain the Sensitive Volume ThicknessIEEE Trans. Nucl. Sci., vol. NS-43,pp. 907-911,1996.
-
IEEE Trans. Nucl. Sci., Vol. NS-43,pp. 907-911,1996.
-
-
Barak, J.1
Levinson, L.2
Akkcrman, A.3
Hass, M.4
Victoria, M.5
Zentner, A.6
David, D.7
Even, O.8
Lifshitz, Y.9
-
8
-
-
0031290198
-
Risk Assessment for Heavy Ions of Parts Tested with Protons
-
P.M. O'Ncill, G.D. Badhwar, and W.X. CulpepperRisk Assessment for Heavy Ions of Parts Tested with ProtonsIEEE Trans. Nucl. Sci., vol. NS-44, pp,2311-2314,1997,
-
IEEE Trans. Nucl. Sci., Vol. NS-44, Pp,2311-2314,1997
-
-
O'Ncill, P.M.1
Badhwar, G.D.2
Culpepper, W.X.3
-
9
-
-
0033311546
-
Scaling of SEU Mapping and Cross Section, and Proton Induced SEU at Reduced Supply Voltage
-
J. Barak, J. Levinson, A. Akkerman, E. Adlor, A. Zentner, D. David, Y, Lifshitz, M. Hass, B.E. Fischer, M. Schlögl, M. Victoria, and W. HajdasScaling of SEU Mapping and Cross Section, and Proton Induced SEU at Reduced Supply VoltageIEEE Trans. Nucl. Sci., vol. NS-46,1342-1353,1999.
-
IEEE Trans. Nucl. Sci., Vol. NS-46,1342-1353,1999.
-
-
Barak, J.1
Levinson, J.2
Akkerman, A.3
Adlor, E.4
Zentner, A.5
David, D.6
Lifshitz7
Hass, M.8
Fischer, B.E.9
Schlögl, M.10
Victoria, M.11
Hajdas, W.12
-
10
-
-
0033350985
-
On the Figure of Merit Model for SEU Rate Calculations
-
J. Barak, R.A. Reed, and K.A. LaBclOn the Figure of Merit Model for SEU Rate CalculationsIEEE Tram: Nucl. Sci., vol. NS-46,pp. 1504-1510,1999.
-
IEEE Tram: Nucl. Sci., Vol. NS-46,pp. 1504-1510,1999.
-
-
Barak, J.1
Reed, R.A.2
Labcl, K.A.3
-
11
-
-
0031367537
-
CREME96: A Revision of the Cosmic Ray Effects on Micro-Electronics Code
-
A.J. Tylka, J.H. Adams, Jr., P.R, Boberg, B. Brownstcin, W.I-. Dietrich, E.G. Flueckiger, E.L. Petersen, M.A. Shea, D.F. Smart, and B.C. SmithCREME96: A Revision of the Cosmic Ray Effects on Micro-Electronics CodeIEEE Trans. Nucl. Sci., vol. NS-44,pp. 2150-2160,1997.
-
IEEE Trans. Nucl. Sci., Vol. NS-44,pp. 2150-2160,1997.
-
-
Tylka, A.J.1
Adams, J.H.2
Boberg3
Brownstcin, B.4
Dietrich, W.I.-.5
Flueckiger, E.G.6
Petersen, E.L.7
Shea, M.A.8
Smart, D.F.9
Smith, B.C.10
-
12
-
-
33747334343
-
Single Events Upsets in the Dual-Port-Boiird of the MPTB Experimentsubmitted to the proceedings of
-
J. Barak, J.L. Barth, C.M. Scidlcck, C.J, Marshall, P.W. Marshall, M.A. Carts, and R.A. ReedSingle Events Upsets in the Dual-Port-Boiird of the MPTB Experimentsubmitted to the proceedings of RADECS '99, Sept,1999.
-
RADECS '99, Sept,1999.
-
-
Barak, J.1
Barth, J.L.2
Scidlcck, C.M.3
Marshall4
Marshall, P.W.5
Carts, M.A.6
Reed, R.A.7
-
13
-
-
33747367184
-
-
R.A, Reed, private communication.
-
R.A, Reed, private communication.
-
-
-
|