Role of heavy-ion nuclear reactions in determining on-orbit single event error rates

IEEE Transactions on Nuclear Science

Volumn 52, Issue 6, 2005, Pages 2182-2188

  Howe, Christina L ^a,b   Weller, Robert A ^a,b   Reed, Robert A ^a,b   Mendenhall, Marcus H ^a,c   Schrimpf, Ronald D ^a,b   Warren, Kevin M ^a,b   Ball, Dennis R ^a,b   Massengill, Lloyd W ^a,b   LaBel, Kenneth A ^a,d   Howard Jr , Jim W ^a,e   Haddad, Nadim F ^a,f  

^a IEEE   (United States)

^b VANDERBILT UNIVERSITY   (United States)

^c VANDERBILT UNIVERSITY   (United States)

^d NASA HEADQUARTERS   (United States)

^e Jackson and Tull Chartered Engineers   (United States)

^f BAE SYSTEMS   (United States)

Author keywords

Charge deposition; Geant4; Heavy ion; MRED; SEU error rate; Single event upset (SEU)

Indexed keywords

CHARGE DEPOSITION; GEANT4; MRED; SEU ERROR RATE; SINGLE-EVENT UPSET (SEU);

CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; ERROR ANALYSIS; HEAVY IONS;

NUCLEAR PHYSICS;

EID: 33144474888     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2005.860683     Document Type: Conference Paper

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