-
1
-
-
0020948470
-
-
IEEE Trans. Nucl. Sei., NS-30, 4533, (1983).
-
E. L. Petersen, J. B. Langworthy, and S. E. Diehl, Suggested Single Event Upset Figure of Merit, IEEE Trans. Nucl. Sei., NS-30, 4533, (1983).
-
Suggested Single Event Upset Figure of Merit
-
-
Petersen, E.L.1
Langworthy, J.B.2
Diehl, S.E.3
-
2
-
-
0027875527
-
-
IEEE Trans. Nuc. Sei., NS-40, 2888, (1993).
-
E. L. Petersen, J. C. Pickel, E. C. Smith, P. J. Rudeck, and J. R. Letaw, Geometrical Factors in SEE Rate Predictions, IEEE Trans. Nuc. Sei., NS-40, 2888, (1993).
-
J. C. Pickel, E. C. Smith, P. J. Rudeck, and J. R. Letaw, Geometrical Factors in SEE Rate Predictions
-
-
Petersen, E.L.1
-
4
-
-
0030361817
-
-
IEEE Trans. Nuc. Sei., NS-43, 2827, (1996).
-
P. Calvel, C. Barillot, P. Lamothe, R. Ecoffet, S. Duzellier, and D. Falguere, An Empirical Model for Predicting Proton Induced Upset, IEEE Trans. Nuc. Sei., NS-43, 2827, (1996).
-
An Empirical Model for Predicting Proton Induced Upset
-
-
Calvel, P.1
Barillot, C.2
Lamothe, P.3
Ecoffet, R.4
Duzellier, S.5
Falguere, D.6
-
8
-
-
0001671884
-
-
IEEE Trans. Nuc. Sei., NS-39, 1577, (1992).
-
E. L. Petersen. J. C. Pickel, J. H. Adams, Jr., and E. C. Smith, Rate Predictions for Single Event Effects - A Critique, IEEE Trans. Nuc. Sei., NS-39, 1577, (1992).
-
J. C. Pickel, J. H. Adams, Jr., and E. C. Smith, Rate Predictions for Single Event Effects - A Critique
-
-
Petersen, E.L.1
-
9
-
-
33747243166
-
-
Microsoft Corporation.
-
Microsoft Corporation.
-
-
-
-
10
-
-
0029293603
-
-
IEEE Trans. Nuc. Sei., NS-42, 73, (April 1995).
-
L. W. Connell, P. J. McDaniel, A. K. Prinja, and F. W. Sexton, Modeling the Heavy Ion Upset Cross Section, IEEE Trans. Nuc. Sei., NS-42, 73, (April 1995).
-
P. J. McDaniel, A. K. Prinja, and F. W. Sexton, Modeling the Heavy Ion Upset Cross Section
-
-
Connell, L.W.1
-
11
-
-
0029521841
-
-
IEEE Trans. Nuc. Sei., NS-42, 2026, (1995).
-
L. W. Connell, F. W. Sexton, P, J. McDaniel, and A. K. Prinja, Further Developments of Heavy Ion Cross Section of Single Event Upset: Model (HICUP), IEEE Trans. Nuc. Sei., NS-42, 2026, (1995).
-
F. W. Sexton, P, J. McDaniel, and A. K. Prinja, Further Developments of Heavy Ion Cross Section of Single Event Upset: Model (HICUP)
-
-
Connell, L.W.1
-
14
-
-
0029535998
-
-
IEEE Trans. Nuc. Sei., NS-42, 1772, (1995).
-
E. C. Smith, E. G. Stassinopoulos, K. LaBel, G. B rucker, and C. M. Seidlick, Applications of a Diffusion Model to SEE Cross Section of Modern Devices, IEEE Trans. Nuc. Sei., NS-42, 1772, (1995).
-
E. G. Stassinopoulos, K. LaBel, G. B Rucker, and C. M. Seidlick, Applications of A Diffusion Model to SEE Cross Section of Modern Devices
-
-
Smith, E.C.1
-
16
-
-
0020890076
-
-
TEEE Trans. Nuc. Sei., NS-30, 4481, (1983).
-
W. L. Bendel and E. L. Petersen, Proton Upsets in Orbit, TEEE Trans. Nuc. Sei., NS-30, 4481, (1983).
-
Proton Upsets in Orbit
-
-
Bendel, W.L.1
Petersen, E.L.2
-
17
-
-
0024889740
-
-
IEEE Trans. Nuc. Sei., NS-36, 2344, (1989).
-
Y. Shimano, T Goka, S Kuboyama, K. Kawacht, T. Kanai, and Y. Takami., 'The Measurement and Prediction of Proton Upset, IEEE Trans. Nuc. Sei., NS-36, 2344, (1989).
-
T Goka, S Kuboyama, K. Kawacht, T. Kanai, and Y. Takami., 'The Measurement and Prediction of Proton Upset
-
-
Shimano, Y.1
-
18
-
-
0031343577
-
-
IEEE Trans. Nuc. Sci.,NS-44, 2306, (1997).
-
S. Duzellier, R. Ecoffet, D. Falguere, T. Nuns, L. Guibert, W. Hajdas, and M. C. Calvet, Low Energy Proton Induced SEE in Memories, IEEE Trans. Nuc. Sci.,NS-44, 2306, (1997).
-
R. Ecoffet, D. Falguere, T. Nuns, L. Guibert, W. Hajdas, and M. C. Calvet, Low Energy Proton Induced SEE in Memories
-
-
Duzellier, S.1
-
22
-
-
0029431059
-
-
1995 IEEE Radiation Effects Data Workshop, l, (T995).
-
D. K. Nichols, J. R. Coss, K. P McCarty, H. R. Schwartz, G. M. Swift, R. K. Watson, R. Koga, W. R. Grain, K. B. Crawford, and S. J. Hansel, 'Trends in SEE Susceptibility from Heavy Ions, 1995 IEEE Radiation Effects Data Workshop, l, (T995).
-
J. R. Coss, K. P McCarty, H. R. Schwartz, G. M. Swift, R. K. Watson, R. Koga, W. R. Grain, K. B. Crawford, and S. J. Hansel, 'Trends in SEE Susceptibility from Heavy Ions
-
-
Nichols, D.K.1
-
23
-
-
33747277539
-
-
Device SEE Susceptibility from Heavy Ions (1995-1996), 1997 IEEE Radiation Effects Data Workshop, 1, (1997).
-
D. K. Nichols, J. R. Coss, T. F Miyahira, H. R.Schwartz, G. M. Swift, R. Koga, W. R. Grain, K. B. Crawford, and S. H.Penzin, Device SEE Susceptibility from Heavy Ions (1995-1996), 1997 IEEE Radiation Effects Data Workshop, 1, (1997).
-
J. R. Coss, T. F Miyahira H. R.Schwartz, G. M. Swift, R. Koga, W. R. Grain, K. B. Crawford, and S. H.Penzin
-
-
Nichols, D.K.1
-
24
-
-
33747267838
-
-
Unpublished
-
N. J. Rudie, Unpublished (1996).
-
(1996)
-
-
Rudie, N.J.1
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