Comparison of heavy ion and proton-induced single event effects (SEE) sensitivities

IEEE Transactions on Nuclear Science

Volumn 49 I, Issue 6, 2002, Pages 3135-3141

  Koga, R ^a   Yu, P ^a   Crawford, K ^a   Crain, S ^a   Tran, V ^a  

^a AEROSPACE CORPORATION   (United States)

Author keywords

Effects; Heavy ion induced upsets; Radiation effects; Radiation sensitivity to protons; SEU prediction models; Single event

Indexed keywords

ENERGY TRANSFER; HEAVY IONS; PROTONS; RADIATION EFFECTS;

MICROCIRCUITS;

CIRCUIT THEORY;

EID: 0036957460     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2002.805426     Document Type: Conference Paper

References (25)

1. W. L. Bendel and E. L. Petersen, "Proton upsets in orbit," IEEE Trans. Nucl. Sci., vol. NS-30, pp. 4481-4485, 1983.
2. J. M. Bisgrove et al., "Comparison of soft errors induced by heavy ions and protons," IEEE Trans. Nucl. Sci., vol. NS-33, pp. 1571-1576, 1986.
3. R. Koga et al., "SEU test techniques for 256K SRAMs and comparison of upsets induced by heavy ions and protons," IEEE Trans. Nucl. Sci., vol. 35, pp. 1638-1643, Dec. 1988.
4. P. J. McNulty et al., "Proton-induced nuclear reactions in silicon," IEEE Trans. Nucl. Sci., vol. NS-28, pp. 4007-4012, 1981.
5. G. E. Farrell and P. J. McNulty, "Microdosimetric aspects of proton-induced nuclear reactions in thin layers of silicon," IEEE Trans. Nucl. Sci., vol. NS-29, pp. 2012-2016, 1982.
6. P. M. O'Neill et al., "Internuclear cascade-evaporation model for LET spectra of 200 MeV protons," IEEE Trans. Nucl. Sci., vol. 45, pp. 2467-2474, Dec. 1998.
7. T. Bion and J. Bourrieau, "A model for proton-induced SEU," IEEE Trans. Nucl. Sci., vol. 36, pp. 2281-2286, Dec. 1989.
8. B. Doucin et al., "Characterization of proton interactions in electronic components," IEEE Trans. Nucl. Sci., vol. 41, pp. 593-600, Apr. 1994.
9. J. Barak et al., "A simple model for calculating proton induced SEU," in Proc. RADECS'95, 1995, pp. 431-436.
10. J. G. Rollins, "Estimation of proton upset rates from heavy ion test data (ICs)," IEEE Trans. Nucl. Sci., vol. 37, pp. 1961-1965, Dec. 1990.
11. C. Inguimbert et al., "Proton upset rate simulation by a Monte Carlo method," IEEE Trans. Nucl. Sci., vol. 44, pp. 2243-2249, Dec. 1997.
12. P. Calvel et al., "An empirical model for predicting proton induced upset," IEEE Trans. Nucl. Sci., vol. 43, pp. 2827-2832, Dec. 1996.
13. E. L. Petersen, "The relationship of proton and heavy ion upset thresholds," IEEE Trans. Nucl. Sci., vol. 39, pp. 1600-1604, Oct. 1992.
14. E. Normand, "Extensions of the burst generation rate method for wider application to proton/neutron-induced single event effects," IEEE Trans. Nucl. Sci., vol. 45, pp. 2904-2914, Dec. 1998.
15. R. A. Reed et al., "A simple algorithm for predicting proton SEU rates in space compared to the rates measured on the CRRES satellite," IEEE Trans. Nucl. Sci., vol. 41, pp. 2389-2395, Dec. 1994.
16. L. D. Edmonds, "Proton SEU cross sections derived from heavy-ion test data," IEEE Trans. Nucl. Sci., vol. 47, pp. 1713-1728, Oct. 2000.
17. R. Koga et al., "Permanent single event functional interrupts (SEFIs) in 128- and 256-megabit synchronous dynamic random acess memeries (SDRAMs)," in IEEE Data Workshop Record, 2001, pp. 6-13.
18. R. Koga et al., "SEFI sensitivity in microcircuits," in RADECS97, 1997, pp. 311-318.
19. R. Koga et al., "Single event transient (SWT) sensitivity of advtnced BiCMOS technology (ABT) buffers and transceivers," in IEEE Data Workshop Record, 2002, pp. 67-74.
20. "SPACE RADIATION," Severn Commun. Corp.
21. W. J. Stapor et al., "Two parameter Bendel model," IEEE Trans. Nucl. Sci., vol. 37, pp. 1966-1973, Dec. 1990.
22. R. A. Reed and P. J. McNulty, "Effects of geometry on the proton SEU dependence on the angle of incidence," IEEE Trans. Nucl. Sci., vol. 42, pp. 1803-1808, Oct. 1995.
23. R. L. Pease et al., "Critical charge for single-event transients (SETs) in Bipolar linear circuits," IEEE Trans. Nucl. Sci., vol. 48, pp. 1966-1979, Dec. 2001.
24. R. A. Reed et al., "Effects of proton Bedm angle-if-incidence on single-event upset cross-section," IEEE Trans. Nucl. Sci., vol. 49, 2002.
25. P. J. McNulty et al., "Upset phenomena Induced by Energetic protons and electrons," IEEE Trans. Nucl. Sci., vol. NS-27, pp. 1516-1522, 1980.