Light particle-induced single event degradation in SDRAMs

IEEE Transactions on Nuclear Science

Volumn 53, Issue 6, 2006, Pages 3544-3549

  David, J P ^a   Bezerra, F ^b   Lorfevre E ^b   Nuns, T ^a   Inguimbert, C ^a  

^a ONERA   (France)

^b CNES   (France)

Author keywords

Degradation; Nucleons; SDRAM; SEE

Indexed keywords

ANNEALING; LEAKAGE CURRENTS; NEUTRONS; PROTONS;

DATA RETENTION; SDRAM; SEE;

RANDOM ACCESS STORAGE;

EID: 33846305725     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2006.886210     Document Type: Conference Paper

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