메뉴 건너뛰기




Volumn 80, Issue 7, 2002, Pages 1282-1284

Observation of latent reliability degradation in ultrathin oxides after heavy-ion irradiation

Author keywords

[No Author keywords available]

Indexed keywords

CONSTANT VOLTAGE; GAMMA IRRADIATION; ION FLUENCES; LINEAR ENERGY TRANSFER; RELIABILITY DEGRADATION; STRESS CONDITION; TIME DEPENDENT DIELECTRIC BREAKDOWN; ULTRA-THIN OXIDE;

EID: 79956033243     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1448859     Document Type: Article
Times cited : (47)

References (15)
  • 1
    • 79957947583 scopus 로고
    • RADECS95, iee IEEPAD 0018-9219
    • G. M. Swift and R. Katz, RADECS95 Proc. IEEE 95, 425 (1995). iee IEEPAD 0018-9219
    • (1995) Proc. IEEE , vol.95 , pp. 425
    • Swift, G.M.1    Katz, R.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.