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Volumn 18, Issue 49, 2006, Pages 11131-11138
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Denuded zone in Czochralski silicon wafer with high carbon content
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Author keywords
[No Author keywords available]
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Indexed keywords
ANNEALING;
CRYSTAL DEFECTS;
CRYSTAL GROWTH FROM MELT;
INTEGRATED CIRCUITS;
OXYGEN;
BULK MICRO DEFECTS (BMD);
CZOCHRALSKI SILICON;
OXYGEN PRECIPITATES;
SILICON WAFERS;
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EID: 33846043579
PISSN: 09538984
EISSN: 1361648X
Source Type: Journal
DOI: 10.1088/0953-8984/18/49/007 Document Type: Article |
Times cited : (5)
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References (28)
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