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Volumn 18, Issue 49, 2006, Pages 11131-11138

Denuded zone in Czochralski silicon wafer with high carbon content

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CRYSTAL DEFECTS; CRYSTAL GROWTH FROM MELT; INTEGRATED CIRCUITS; OXYGEN;

EID: 33846043579     PISSN: 09538984     EISSN: 1361648X     Source Type: Journal    
DOI: 10.1088/0953-8984/18/49/007     Document Type: Article
Times cited : (5)

References (28)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.