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Volumn 74, Issue 22, 2006, Pages

Kinetic Monte Carlo simulations of ion-induced ripple formation: Dependence on flux, temperature, and defect concentration in the linear regime

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EID: 33845464725     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.74.224103     Document Type: Article
Times cited : (35)

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