Simulations of submicrometer-scale roughening on ion-bombarded solid surfaces

Physical Review B - Condensed Matter and Materials Physics

Volumn 54, Issue 19, 1996, Pages 13502-13505

  Koponen, I ^a   Hautala, M ^a   Sievanen O ^a  

^a UNIVERSITY OF HELSINKI   (Finland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000373142     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.54.13502     Document Type: Article

References (12)

1. E. A. Eklund, R. Bruinsma, J. Rudnick and R. S. Williams, Phys. Rev. Lett. 67, 1759 (1991).
2. J. Krim, I. Heyvaert, C. Van Haesendonck and Y. Bruynseraede, Phys. Rev. Lett. 70, 57 (1993).
3. R. Cuerno and A.-L. Barabási, Phys. Rev. Lett. 74, 4746 (1995).
4. M. Rost and J. Krug, Phys. Rev. Lett. 75, 3894 (1995).
5. I. Koponen and M. Hautala, Nucl. Instrum. Methods Phys. Res. Sect. B 103, 156 (1995).
6. M. Hautala, Phys. Rev. B 30, 5010 (1984).
7. M. Hautala and J. Likonen, Phys. Rev. B 41, 1759 (1990).
8. D. E. Wolf and J. Villain, Europhys. Lett. 13, 389 (1990).
9. S. Das Sarma and P. Tamborenea, Phys. Rev. Lett. 66, 325 (1991).
10. S. Das Sarma and S. V. Ghaisas, Phys. Rev. Lett. 69, 3762 (1992).
11. P. Smilauer and M. Kotrla, Phys. Rev. B 49, 5769 (1994).
12. A. Gras-Martí, R. Smith, K. Beardmore, J.-J. Jiménez-Rodríguez, V. Konoplev and J. Ferrón, Comput. Mater. Sci. 3, 413 (1995).