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Volumn 84, Issue 8, 2004, Pages 1374-1376

Surface relaxation in ion-etch nanopatterning

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; BOUNDARY CONDITIONS; COMPUTER SIMULATION; DEPOSITION; DIFFUSION; MATHEMATICAL MODELS; MORPHOLOGY; REACTIVE ION ETCHING; SPUTTERING; SURFACE TENSION; WHITE ACOUSTIC NOISE;

EID: 1642325151     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1650546     Document Type: Article
Times cited : (19)

References (17)
  • 13
    • 6344284295 scopus 로고    scopus 로고
    • edited by M. Laudon and B. Romanowicz (Computational Publications, San Francisco)
    • M. Stepanova and S. K. Dew, in Nanotech 2003 Proceedings, edited by M. Laudon and B. Romanowicz (Computational Publications, San Francisco, 2003), Vol. 3, p. 211.
    • (2003) Nanotech 2003 Proceedings , vol.3 , pp. 211
    • Stepanova, M.1    Dew, S.K.2
  • 14
    • 1642407182 scopus 로고    scopus 로고
    • We obtain the cascade parameters from the SRIM simulation, http://www.srim.org/.
  • 16
    • 1642405544 scopus 로고    scopus 로고
    • note
    • eff can replace the diffusivity to estimate the interriple distance by the expression 2π √2D/|v|.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.