Vacancy diffusion in the Cu(0 0 1) surface I: An STM study

Surface Science

Volumn 521, Issue 1-2, 2002, Pages 10-25

  Van Gastel, R ^a   Somfai, E ^b,c   Van Albada, S B ^a   Van Saarloos, W ^b   Frenken, J W M ^a  

^a LEIDEN UNIVERSITY   (Netherlands)

^b UNIVERSITEIT LEIDEN   (Netherlands)

^c UNIVERSITY OF WARWICK   (United Kingdom)

Author keywords

Copper; Indium; Scanning tunneling microscopy; Surface defects; Surface diffusion

Indexed keywords

ABSORPTION; CRYSTALS; DIFFUSION; LATTICE CONSTANTS; SCANNING TUNNELING MICROSCOPY; SURFACE PHENOMENA;

SURFACE DEFECTS;

COPPER;

EID: 0037058740     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(02)02250-1     Document Type: Article

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