Characterization of the Si:H network during transformation from amorphous to micro- and nanocrystalline structures

Journal of Applied Physics

Volumn 100, Issue 10, 2006, Pages

  Das, Debajyoti ^a   Bhattacharya, Koyel ^a  

^a DEPARTMENT OF MATERIALS SCIENCE   (India)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS MATERIALS; CHARGE CARRIERS; CRYSTALLINE MATERIALS; ELECTRIC CONDUCTIVITY; GRAIN BOUNDARIES; OPTICAL PROPERTIES;

ELECTRICAL TRANSPORT; NANOCRYSTALLINE STRUCTURES; NANOCRYSTALLINITY;

NANOSTRUCTURED MATERIALS;

EID: 33845233578     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2384812     Document Type: Article

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