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Volumn 66, Issue 1-4, 2001, Pages 421-429

Microcrystalline silicon films deposited by hot-wire CVD for solar cells on low-temperature substrate

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS FILMS; CHEMICAL VAPOR DEPOSITION; CRYSTALLINE MATERIALS; ELLIPSOMETRY; FILM PREPARATION; HYDROGEN; LOW TEMPERATURE EFFECTS; THIN FILMS;

EID: 0035253958     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0927-0248(00)00203-8     Document Type: Article
Times cited : (16)

References (11)
  • 8
    • 0001426578 scopus 로고    scopus 로고
    • Comparative study of microcrystalline silicon films prepared in low or high pressure regime by hot-wire chemical vapor deposition
    • Niikura C., Guillet J., Brenot R., Bourée J.E., Voz C., Peiro D., Asensi J.M., Bertomeu J., Andreu J. Comparative study of microcrystalline silicon films prepared in low or high pressure regime by hot-wire chemical vapor deposition. J. Non-Cryst. Solids. 266-269:2000;385-390.
    • (2000) J. Non-Cryst. Solids , vol.266-269 , pp. 385-390
    • Niikura, C.1    Guillet, J.2    Brenot, R.3    Bourée, J.E.4    Voz, C.5    Peiro, D.6    Asensi, J.M.7    Bertomeu, J.8    Andreu, J.9


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.