Effect of normal load on microscale friction measurements

Thin Solid Films

Volumn 278, Issue 1-2, 1996, Pages 49-56

  Bhushan, Bharat ^a   Kulkarni, Ashok V ^a  

^a OHIO STATE UNIVERSITY   (United States)

Author keywords

Atomic force microscopy; Nanostructures; Tribology

Indexed keywords

ATOMIC FORCE MICROSCOPY; INTERFACES (MATERIALS); LOADS (FORCES); NANOSTRUCTURED MATERIALS; PROTECTIVE COATINGS; SILICON; THIN FILMS; TRIBOLOGY; WEAR OF MATERIALS;

FRICTION COEFFICIENT; FRICTION FORCE MICROSCOPY; MICROSCALE FRICTION MEASUREMENTS;

FRICTION;

EID: 0030146539     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/0040-6090(95)08138-0     Document Type: Article

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