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Volumn 15, Issue 12, 2004, Pages 1785-1791

Characterization of nanomechanical and nanotribological properties of digital micromirror devices

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION; ELASTICITY; FRICTION; INTERFACES (MATERIALS); MIRRORS; NANOSTRUCTURED MATERIALS; TRIBOLOGY;

EID: 11144351035     PISSN: 09574484     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-4484/15/12/016     Document Type: Article
Times cited : (26)

References (15)
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    • DMD reliability: A MEMS success story
    • ed R Ramesham and D Tanner (Bellingham, WA: SPIE Optical Engineering Press)
    • Douglass M R 2003 DMD reliability: a MEMS success story Proc. Reliability, Testing, and Characterization of MEMS/MOEMS II vol 4980, ed R Ramesham and D Tanner (Bellingham, WA: SPIE Optical Engineering Press) pp 1-11
    • (2003) Proc. Reliability, Testing, and Characterization of MEMS/MOEMS II , vol.4980 , pp. 1-11
    • Douglass, M.R.1
  • 6
    • 11144316703 scopus 로고    scopus 로고
    • Vapor phase low molecular weight lubricants US Patent Specification 6,251,842 B 1
    • Gudeman C S 2001 Vapor phase low molecular weight lubricants US Patent Specification 6,251,842 B 1
    • (2001)
    • Gudeman, C.S.1
  • 7
    • 11144274396 scopus 로고
    • Low reset voltage process for DMD US Patent Specification 5,331,454
    • Hornbeck L J 1994 Low reset voltage process for DMD US Patent Specification 5,331,454
    • (1994)
    • Hornbeck, L.J.1
  • 8
    • 0000446793 scopus 로고    scopus 로고
    • The DMD™ projection display chip: A MEMS-based technology
    • Hornbeck L J 2001 The DMD™ projection display chip: a MEMS-based technology Mater. Res. Soc. Bull. 26 325-8
    • (2001) Mater. Res. Soc. Bull. , vol.26 , pp. 325-328
    • Hornbeck, L.J.1
  • 9
    • 3042607950 scopus 로고    scopus 로고
    • Nanotribological characterization of digital micromirror devices using an atomic force microscope
    • Liu H and Bhushan B 2004a Nanotribological characterization of digital micromirror devices using an atomic force microscope Ultramicroscopy 100 391-412
    • (2004) Ultramicroscopy , vol.100 , pp. 391-412
    • Liu, H.1    Bhushan, B.2
  • 10
    • 4344660591 scopus 로고    scopus 로고
    • Investigation of nanotribological and nanomechanical properties of the digital micromirror devices by atomic force microscopy
    • Liu H and Bhushan B 2004b Investigation of nanotribological and nanomechanical properties of the digital micromirror devices by atomic force microscopy J. Vac. Sci. Technol. A 22 1388-96
    • (2004) J. Vac. Sci. Technol. A , vol.22 , pp. 1388-1396
    • Liu, H.1    Bhushan, B.2
  • 11
    • 4544385882 scopus 로고    scopus 로고
    • Bending and fatigue study on a nanoscale hinge by an atomic force microscope
    • Liu H and Bhushan B 2004c Bending and fatigue study on a nanoscale hinge by an atomic force microscope Nanotechnology 15 1246-51
    • (2004) Nanotechnology , vol.15 , pp. 1246-1251
    • Liu, H.1    Bhushan, B.2
  • 12
    • 0037202396 scopus 로고    scopus 로고
    • Development of AFM-based techniques to measure mechanical properties of nanoscale structures
    • Sundararajan S and Bhushan B 2002 Development of AFM-based techniques to measure mechanical properties of nanoscale structures Sensors Actuators A 101 338-51
    • (2002) Sensors Actuators A , vol.101 , pp. 338-351
    • Sundararajan, S.1    Bhushan, B.2
  • 13
    • 3042606230 scopus 로고    scopus 로고
    • Nanomechanical characterization of multilayered thin film structures for digital micromirror devices
    • Wei G, Bhushan B and Jacobs S J 2004a Nanomechanical characterization of multilayered thin film structures for digital micromirror devices Ultramicroscopy 100 375-89
    • (2004) Ultramicroscopy , vol.100 , pp. 375-389
    • Wei, G.1    Bhushan, B.2    Jacobs, S.J.3
  • 14
    • 4444279728 scopus 로고    scopus 로고
    • Nanoscale fatigue and fracture toughness measurements of multilayered thin film structures for digital micromirror devices
    • Wei G, Bhushan B and Jacobs S J 2004b Nanoscale fatigue and fracture toughness measurements of multilayered thin film structures for digital micromirror devices J. Vac. Sci. Technol. A 22 1397-405
    • (2004) J. Vac. Sci. Technol. A , vol.22 , pp. 1397-1405
    • Wei, G.1    Bhushan, B.2    Jacobs, S.J.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.