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Volumn 38, Issue 11, 2006, Pages 1459-1471

Coupling evanescent-wave fluorescence imaging and spectroscopy with scanning probe microscopy: Challenges and insights from TIRF-AFM

Author keywords

Atomic force microscopy; Evanescent wave microscopy; Fluorescence imaging; Scanning probe microscopy

Indexed keywords

ATOMIC FORCE MICROSCOPY; CELLS; FLUORESCENCE; LIGHT REFLECTION; OPTICAL PROPERTIES; PROTEINS;

EID: 33750919274     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.2444     Document Type: Review
Times cited : (25)

References (119)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.