Sub-diffraction-limited optical imaging with a silver superlens

Science

Volumn 308, Issue 5721, 2005, Pages 534-537

  Fang, Nicholas ^a   Lee, Hyesog ^a   Sun, Cheng ^a   Zhang, Xiang ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGE PROCESSING; LENSES; NANOSTRUCTURED MATERIALS; OPTOELECTRONIC DEVICES; SPECTRUM ANALYSIS; SURFACE PLASMON RESONANCE; THICKNESS CONTROL; WAVES;

EVANESCENT WAVES; OPTICAL IMAGING; SILVER SUPERLENS; WAVELENGTHS;

SILVER;

SILVER;

IMAGING METHOD; OPTICAL INSTRUMENT;

ARTICLE; DEVICE; DIFFRACTION; EXCITATION; ILLUMINATION; OPTICAL RESOLUTION; OPTICS; PREDICTION; PRIORITY JOURNAL; THICKNESS;

EID: 17644419669     PISSN: 00368075     EISSN: None     Source Type: Journal    
DOI: 10.1126/science.1108759     Document Type: Article

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33. The authors acknowledge support from the Office of Naval Research (ONR)/Defense Advanced Research Projects Agency Multidisciplinary University Research Initiative (MURI) (ONR grant N00014-01-1-0803) and from NSF for the Center for Nanoscale Science and Engineering (grant DMI-0327077).