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Volumn 28, Issue 1-2, 2000, Pages 197-202
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Total internal reflection microscopy and atomic force microscopy (TIRFM-AFM) to study stress transduction mechanisms in endothelial cells
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
CELLS;
ELASTICITY;
INTERFACES (MATERIALS);
SUBSTRATES;
CELL SURFACE;
ENDOTHELIAL CELL;
STRESS TRANSDUCTION MECHANISMS;
TOTAL INTERNAL REFLECTION MICROSCOPY;
CYTOLOGY;
ATOMIC FORCE MICROSCOPY;
CELL ADHESION;
CELL CONTACT;
CELL SURFACE;
CONFERENCE PAPER;
CYTOSKELETON;
ELASTICITY;
ENDOTHELIUM CELL;
EXTRACELLULAR MATRIX;
FORCE;
PRIORITY JOURNAL;
REFLECTOMETRY;
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EID: 0033822756
PISSN: 0278940X
EISSN: None
Source Type: Journal
DOI: 10.1615/CritRevBiomedEng.v28.i12.340 Document Type: Conference Paper |
Times cited : (19)
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References (5)
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