Accurate and analytical strain mapping at the surface of Ge/Si(0 0 1) islands by an improved flat-island approximation

Surface Science

Volumn 600, Issue 20, 2006, Pages 4777-4784

  Zinovyev, V A ^a   Vastola, G ^a   Montalenti, F ^a   Miglio, Leo ^a  

^a UNIVERSITY OF MILANO BICOCCA   (Italy)

Author keywords

Epitaxy; Germanium; Green's function methods; Molecular dynamics; Self assembly; Silicon; Strain

Indexed keywords

ANALYTICAL STRAIN MAPPING; FLAT-ISLAND APPROXIMATION; GE/SI(0 0 1) ISLANDS;

COMPUTER SIMULATION; GERMANIUM; GREEN'S FUNCTION; SELF ASSEMBLY; SILICON;

MOLECULAR DYNAMICS;

EID: 33750026713     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2006.07.047     Document Type: Article

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