Self-organized nanoscale structures in Si/Ge films

Surface Science

Volumn 386, Issue 1-3, 1997, Pages 169-181

  Liu, Feng ^a   Lagally, M G ^a  

^a UNIVERSITY OF WISCONSIN MADISON   (United States)

Author keywords

Atomic force microscopy; Germanium; Growth; Heterostructures; Scanning tunneling microscopy; Semiconducting interfaces; Semiconducting surfaces; Silicon; Surface stress

Indexed keywords

HETEROJUNCTIONS; LATTICE CONSTANTS; MORPHOLOGY; NANOSTRUCTURED MATERIALS; SEMICONDUCTING GERMANIUM; SEMICONDUCTING SILICON; SEMICONDUCTOR QUANTUM DOTS;

SELF ORGANIZED NANOSCALE STRUCTURES;

SEMICONDUCTING FILMS;

EID: 0031249362     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(97)00303-8     Document Type: Article

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