Dependence of calculated electron effective attenuation lengths on transport mean free paths obtained from two atomic potentials

Surface and Interface Analysis

Volumn 38, Issue 10, 2006, Pages 1348-1356

  Powell, C J ^a   Jablonski, A ^b  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b INSTITUTE OF PHYSICAL CHEMISTRY   (Poland)

Author keywords

AES; Electron effective attenuation length; Transport mean free path; XPS

Indexed keywords

ATOMIC POTENTIALS; ELECTRON EFFECTIVE ATTENUATION LENGTH; TRANSPORT MEAN FREE PATH;

ALGORITHMS; DATABASE SYSTEMS; DIELECTRIC MATERIALS; PHOTOMULTIPLIERS; SUBSTRATES; X RAY PHOTOELECTRON SPECTROSCOPY;

ATTENUATION;

EID: 33749562132     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.2460     Document Type: Article

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