Electron effective attenuation lengths in electron spectroscopies

Journal of Alloys and Compounds

Volumn 362, Issue 1-2, 2004, Pages 26-32

  Jablonski, A ^a   Powell, C J ^b  

^a INSTITUTE OF PHYSICAL CHEMISTRY   (Poland)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

Auger electron spectroscopy; Effective attenuation length; X ray photoelectron spectroscopy

Indexed keywords

ATTENUATION; SCATTERING; SURFACE STRUCTURE; SYNCHROTRON RADIATION; X RAY PHOTOELECTRON SPECTROSCOPY;

EFFECTIVE ATTENUATION LENGTH (EAL); PHOTOELECTRONS;

ELECTRON SPECTROSCOPY;

EID: 0344035311     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0925-8388(03)00558-9     Document Type: Conference Paper

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