SCOPUS 정보 검색 플랫폼

Applied Physics A: Materials Science and Processing

Volumn 72, Issue 7, 2001, Pages

Instrumentation of STM and AFM combined with Transmission Electron Microscope

(4) Erts, D a Lohmus A b Lohmus R b Olin, H c

a UNIVERSITY OF LATVIA (Latvia)

b UNIVERSITY OF TARTU (Estonia)

c CHALMERS UNIVERSITY OF TECHNOLOGY (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0002254813 PISSN: 09478396 EISSN: None Source Type: Journal
DOI: 10.1007/s003390100636 Document Type: Article

Times cited : (41)

References (37)

1
- 36449008228
- M.I. Lutwyche, Y. Wada: Appl. Phys. Lett. 66, 2807 (1995)
- (1995) Appl. Phys. Lett. , vol.66 , pp. 2807
- Lutwyche, M.I.¹ Wada, Y.²

2
- 13544274622
- Y. Naitoh, K. Takayanagi, M. Tomitori: Surf. Sci. 357-358, 208 (1996)
- (1996) Surf. Sci. , vol.357-358 , pp. 208
- Naitoh, Y.¹ Takayanagi, K.² Tomitori, M.³

3
- 0032558717
- H. Ohnishi, Y. Kondo, K. Takayanagi: Nature 395, 780 (1998)
- (1998) Nature , vol.395 , pp. 780
- Ohnishi, H.¹ Kondo, Y.² Takayanagi, K.³

4
- 0032621909
- J. Yamashita, H. Hirayama, Y. Ohshima, K. Takayanagi: Appl. Phys. Lett. 74, 2450 (1999)
- (1999) Appl. Phys. Lett. , vol.74 , pp. 2450
- Yamashita, J.¹ Hirayama, H.² Ohshima, Y.³ Takayanagi, K.⁴

5
- 0034093472
- Y. Naitoh, K. Takayanagi, Y. Ohshima, H. Hirayama: J. Electron Microsc. 49, 211 (2000)
- (2000) J. Electron Microsc. , vol.49 , pp. 211
- Naitoh, Y.¹ Takayanagi, K.² Ohshima, Y.³ Hirayama, H.⁴

6
- 0001396974
- T. Kizuka, K. Yamada, S. Deguchi, M. Naruse, N. Tanaka: Phys. Rev. B 55, R7398 (1997)
- (1997) Phys. Rev. B , vol.55
- Kizuka, T.¹ Yamada, K.² Deguchi, S.³ Naruse, M.⁴ Tanaka, N.⁵

7
- 0032538715
- T. Kizuka: Phys. Rev. Lett. 81, 4448 (1998)
- (1998) Phys. Rev. Lett. , vol.81 , pp. 4448
- Kizuka, T.¹

8
- 0000974174
- T. Kizuka: Phys. Rev. B 57, 11 158 (1998)
- (1998) Phys. Rev. B , vol.57 , pp. 11158
- Kizuka, T.¹

9
- 0000785329
- T. Kizuka: Phys. Rev. B 59, 4646 (1999)
- (1999) Phys. Rev. B , vol.59 , pp. 4646
- Kizuka, T.¹

10
- 0000367093
- D. Erts, H. Olin, L. Ryen, E. Olsson, A. Thölén: Phys. Rev. B 61, 12 725 (2000)
- (2000) Phys. Rev. B , vol.61 , pp. 12725
- Erts, D.¹ Olin, H.² Ryen, L.³ Olsson, E.⁴ Thölén, A.⁵

11
- 0023580985
- J.C.H. Spence: Ultramicroscopy 25, 165 (1988)
- (1988) Ultramicroscopy , vol.25 , pp. 165
- Spence, J.C.H.¹

12
- 25844483886
- M. Kuwabara, W.K. Lo, J.C.H. Spence: J. Vac. Sci. Technol. A 7, 165 (1989)
- (1989) J. Vac. Sci. Technol. A , vol.7 , pp. 165
- Kuwabara, M.¹ Lo, W.K.² Spence, J.C.H.³

13
- 0025471550
- J.C.H. Spence, W. Lo, M. Kuwabara: Ultramicroscopy 33, 69 (1990)
- (1990) Ultramicroscopy , vol.33 , pp. 69
- Spence, J.C.H.¹ Lo, W.² Kuwabara, M.³

14
- 0027578612
- W.K. Lo, J.C.H. Spence: Ultramicroscopy 48, 433 (1993)
- (1993) Ultramicroscopy , vol.48 , pp. 433
- Lo, W.K.¹ Spence, J.C.H.²

15
- 84962979664
- M. Iwatsuki, K. Murooka, S. Kitamura, K. Takayanagi, Y. Harada: J. Electron Microsc. 40, 48 (1991)
- (1991) J. Electron Microsc. , vol.40 , pp. 48
- Iwatsuki, M.¹ Murooka, K.² Kitamura, S.³ Takayanagi, K.⁴ Harada, Y.⁵

16
- 0029299301
- M.I. Lutwyche, Y. Wada: Sens. Actuators A 48, 127 (1995)
- (1995) Sens. Actuators A , vol.48 , pp. 127
- Lutwyche, M.I.¹ Wada, Y.²

17
- 25844444216
- Y. Kondo, H. Ohnishi, Q. Ru, H. Kimata, K. Takayanagi: Microsc. Microanal. 153, 241 (1997)
- (1997) Microsc. Microanal. , vol.153 , pp. 241
- Kondo, Y.¹ Ohnishi, H.² Ru, Q.³ Kimata, H.⁴ Takayanagi, K.⁵

18
- 0346587449
- J.M. Gomezrodriguez, A.M. Baro: Inst. Phys. Conf. Ser. 99, 177 (1989)
- (1989) Inst. Phys. Conf. Ser. , vol.99 , pp. 177
- Gomezrodriguez, J.M.¹ Baro, A.M.²

19
- 0342474660
- E.E. Ehrihs, W.F. Smith, A.L. Delozanne: J. Vac. Sci. Technol. B 9, 1380 (1991)
- (1991) J. Vac. Sci. Technol. B , vol.9 , pp. 1380
- Ehrihs, E.E.¹ Smith, W.F.² Delozanne, A.L.³

20
- 0009303957
- V.S. Edelman, A.M. Troyanoskii, M.S. Khaikin, G.A. Stepanyan, A.P. Volodin: J. Vac. Sci. Technol. B 9, 618 (1991)
- (1991) J. Vac. Sci. Technol. B , vol.9 , pp. 618
- Edelman, V.S.¹ Troyanoskii, A.M.² Khaikin, M.S.³ Stepanyan, G.A.⁴ Volodin, A.P.⁵

21
- 0026900135
- K. Nakomoto, K. Uozumi: Ultramicroscopy 42, 1569 (1992)
- (1992) Ultramicroscopy , vol.42 , pp. 1569
- Nakomoto, K.¹ Uozumi, K.²

22
- 0026898546
- A.O. Golubok, V.A. Timofeev: Ultramicroscopy 42, 1558 (1992)
- (1992) Ultramicroscopy , vol.42 , pp. 1558
- Golubok, A.O.¹ Timofeev, V.A.²

23
- 0026899923
- M. Troyon, H.N. Lei, A. Bourhettar: Ultramicroscopy 42, 1564 (1992)
- (1992) Ultramicroscopy , vol.42 , pp. 1564
- Troyon, M.¹ Lei, H.N.² Bourhettar, A.³

24
- 0003889798
- G.C. Rosolen, A.C.F. Hoole, M.E. Welland, A.N. Broers: Appl. Phys. Lett. 63, 2435 (1993)
- (1993) Appl. Phys. Lett. , vol.63 , pp. 2435
- Rosolen, G.C.¹ Hoole, A.C.F.² Welland, M.E.³ Broers, A.N.⁴

25
- 25844516673
- A. Asenjo, A. Buendia, J.M. Gomezrodriguez, A.M. Baro: J. Vac. Sci. Technol. B 12, 1568 (1994)
- (1994) J. Vac. Sci. Technol. B , vol.12 , pp. 1568
- Asenjo, A.¹ Buendia, A.² Gomezrodriguez, J.M.³ Baro, A.M.⁴

26
- 0013119606
- A.V. Ermakov, A. Garfunkel: Rev. Sci. Instrum. 65, 2853 (1994)
- (1994) Rev. Sci. Instrum. , vol.65 , pp. 2853
- Ermakov, A.V.¹ Garfunkel, A.²

27
- 0028527998
- P.M. Thibado, Y. Liang, D.A. Bonell: Rev. Sci. Instrum. 65, 3199 (1994)
- (1994) Rev. Sci. Instrum. , vol.65 , pp. 3199
- Thibado, P.M.¹ Liang, Y.² Bonell, D.A.³

28
- 0004007838
- U. Memmert, U. Hodel, U. Hartman: Rev. Sci. Instrum. 67, 2269 (1996)
- (1996) Rev. Sci. Instrum. , vol.67 , pp. 2269
- Memmert, U.¹ Hodel, U.² Hartman, U.³

29
- 0031256427
- A. Wiesner, J. Kirshner, G. Schafer, T. Berghaus: Rev. Sci. Instrum. 68, 3790 (1997)
- (1997) Rev. Sci. Instrum. , vol.68 , pp. 3790
- Wiesner, A.¹ Kirshner, J.² Schafer, G.³ Berghaus, T.⁴

30
- 0032651892
- M.F.Yu, M.J. Dyer, G.D. Skidmore, H.W. Rohrs, X.K. Lu, K.D. Ausman, J.R. von Ehr, R.S. Ruoff: Nanotechnology 10, 244 (1999).
- (1999) Nanotechnology , vol.10 , pp. 244
- Yu, M.F.¹ Dyer, M.J.² Skidmore, G.D.³ Rohrs, H.W.⁴ Lu, X.K.⁵ Ausman, K.D.⁶ Von Ehr, J.R.⁷ Ruoff, R.S.⁸

31
- 0034204828
- F. Fukushima, D. Saya, H. Kawakatsu: Jap. J. Appl. Phys. 1 39, 3747 (2000)
- (2000) Jap. J. Appl. Phys. 1 , vol.39 , pp. 3747
- Fukushima, F.¹ Saya, D.² Kawakatsu, H.³

32
- 0034205024
- M. Guthold, M.R. Falvo, W.G. Matthews, S. Paulson, S. Washburn, D.A. Erie, R. Superfine, F.P. Brooks, R.M. Taylor: IEEE/ASME Trans. Mechatron. 5, 189 (2000)
- (2000) IEEE/ASME Trans. Mechatron. , vol.5 , pp. 189
- Guthold, M.¹ Falvo, M.R.² Matthews, W.G.³ Paulson, S.⁴ Washburn, S.⁵ Erie, D.A.⁶ Superfine, R.⁷ Brooks, F.P.⁸ Taylor, R.M.⁹

33
- 0031104826
- M. Tortonese: IEEE Eng. Med. Biol. 16, 28 (1997)
- (1997) IEEE Eng. Med. Biol. , vol.16 , pp. 28
- Tortonese, M.¹

34
- 0000963276
- S. Blom, H. Olin, J.L. Costa-Krämer, N. Garcia, M. Jonson, P.A. Serena, R. Shekhter: Phys. Rev. B 57, 8830 (1998)
- (1998) Phys. Rev. B , vol.57 , pp. 8830
- Blom, S.¹ Olin, H.² Costa-Krämer, J.L.³ Garcia, N.⁴ Jonson, M.⁵ Serena, P.A.⁶ Shekhter, R.⁷

35
- 0038509580
- D. Sánchez-Portal, E. Artacho, J. Junquera, P. Ordejón, A. Garcia, J.M. Soler: Phys. Rev. Lett. 83, 3884 (1999)
- (1999) Phys. Rev. Lett. , vol.83 , pp. 3884
- Sánchez-Portal, D.¹ Artacho, E.² Junquera, J.³ Ordejón, P.⁴ Garcia, A.⁵ Soler, J.M.⁶

36
- 0000107764
- C.A. Stafford, F. Kassubek, J. Bürki, H. Grabert: Phys. Rev. Lett. 83, 4836 (1999)
- (1999) Phys. Rev. Lett. , vol.83 , pp. 4836
- Stafford, C.A.¹ Kassubek, F.² Bürki, J.³ Grabert, H.⁴

37
- 4544253610
- G. Rubio, N. Agrait, S. Vieira: Phys. Rev. Lett. 76, 2302 (1996)
- (1996) Phys. Rev. Lett. , vol.76 , pp. 2302
- Rubio, G.¹ Agrait, N.² Vieira, S.³

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.