Simultaneous STM and UHV electron microscope observation of silicon nanowires extracted from Si(111) surface

Journal of Electron Microscopy

Volumn 49, Issue 2, 2000, Pages 211-216

  Naitoh, Y ^a   Takayanagi, K ^a   Oshima, Y ^a   Hirayama, H ^a  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

Reflection electron microscopy; Silicon; STM; Tungsten

Indexed keywords

ATOMS; NANOWIRES; SCANNING TUNNELING MICROSCOPY; SILICON; WIRE;

ATOMIC CLUSTERS; ATOMIC-RESOLUTION; CONSTANT-CURRENT; HIGH-SUBSTRATE TEMPERATURES; REFLEAIA ELEARON MICROSCOPY; SAMPLE SURFACE; SCANNING TUNNELING MIAOSCOPE; SI (1 1 1); TIP SURFACES; TUNGSTEN TIP;

TUNGSTEN;

EID: 0034093472     PISSN: 00220744     EISSN: None     Source Type: Journal    
DOI: 10.1093/oxfordjournals.jmicro.a023800     Document Type: Article

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