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Volumn 31, Issue 8, 2006, Pages 607-613

Characterization of mechanical and thermal properties using ultrafast optical metrology

Author keywords

Laser; Optical; Thin film

Indexed keywords

ACOUSTIC SIGNAL PROCESSING; LASERS; MEASUREMENT THEORY; SPECTROSCOPIC ANALYSIS; THERMODYNAMIC PROPERTIES; THIN FILMS; ULTRAFAST PHENOMENA;

EID: 33748310531     PISSN: 08837694     EISSN: None     Source Type: Journal    
DOI: 10.1557/mrs2006.157     Document Type: Article
Times cited : (83)

References (54)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.