Thermal conductivity imaging at micrometre-scale resolution for combinatorial studies of materials

Nature Materials

Volumn 3, Issue 5, 2004, Pages 298-301

  Huxtable, Scott ^a   Cahill, David G ^a   Fauconnier, Vincent ^a   White, Jeffrey O ^a   Zhao, Ji Cheng ^b  

^a University of Illinois at Urbana Champaign   (United States)

^b GE GLOBAL RESEARCH   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BACKSCATTERING; COMPOSITION; CRYSTALLINE MATERIALS; DIFFUSION; ELECTRON MICROSCOPY; FREQUENCY MODULATION; LASER BEAMS; MORPHOLOGY; PHASE DIAGRAMS; SAMPLING; STOICHIOMETRY; THERMAL BARRIER COATINGS; THERMAL CONDUCTIVITY; THIN FILMS;

COMBINATORIAL SAMPLES; ELECTRON-BACKSCATTER DIFFRACTION; SPATIAL RESOLUTION; THERMOREFLECTANCE;

MATERIALS SCIENCE;

METAL;

ARTICLE; CHEMISTRY; COMBINATORIAL CHEMISTRY; COMPUTER ASSISTED DIAGNOSIS; EVALUATION; MATERIALS TESTING; METHODOLOGY; NANOTECHNOLOGY; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY; THERMAL CONDUCTIVITY; THERMOGRAPHY; VALIDATION STUDY;

COMBINATORIAL CHEMISTRY TECHNIQUES; IMAGE INTERPRETATION, COMPUTER-ASSISTED; MATERIALS TESTING; METALS; NANOTECHNOLOGY; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY; THERMAL CONDUCTIVITY; THERMOGRAPHY;

EID: 2342637728     PISSN: 14761122     EISSN: None     Source Type: Journal    
DOI: 10.1038/nmat1114     Document Type: Article

References (20)

1. Xiang, X.-D. et al. A combinatorial approach to materials discovery. Science 268, 1738-1740 (1995).
2. Xiang, X.-D. Combinatorial materials synthesis and screening: an integrated materials chip approach to discovery and optimization of functional materials. Ann. Rev. Mater. Sci. 29, 149-171 (1999).
3. Zhao, J.-C. A combinatorial approach for efficient mapping of phase diagrams and properties. J. Mater. Res. 16, 1565-1578 (2001).
4. Zhao, J.-C., Jackson, M. R., Peluso, L. A. & Brewer, L. A diffusion multiple approach for accelerated design of structural materials. Mater. Res. Soc. Bull. 27, 324-329 (2002).
5. Gao,C. & Xiang,X.-D. Quantitative microwave near-field microscopy of dielectric properties. Rev. Sci. Instrum. 69, 3846-3851 (1998).
6. Oliver, W. C. & Pharr, G. M. An improved technique for determining hardness and elastic modulus using load and displacement sensing indentation experiments. J. Mater. Res. 7, 1564-1583 (1992).
7. Rosencwaig, A., Opsal, J., Smith, W. L. & Willenborg, D. L. Detection of thermal waves through optical reflectance. Appl. Phys. Lett. 46, 1013-1015 (1985).
8. Majumdar, A. Scanning thermal microscopy. Annu. Rev. Mater. Sci. 29, 505-585 (1999).
9. Cahill, D. G. et al. Nanoscale thermal transport. J. Appl. Phys. 93, 793-818 (2003).
10. Lepoutre, F. et al. Micron-scale thermal characterizations of interfaces parallel or perpendicular to the surface. J. Appl. Phys. 78, 2208-2223 (1995).
11. Li, B., Pottier, L., Roger, J. P., Fournier, D., Watari, K. & Hirao, K. Measuring the anisotropic thermal diffusiviry of silicon nitride grains by thermoreflectance microscopy. J. Eur. Ceram. Soc. 19, 1631-1639 (1999).
12. Paddock, C. A. & Eesley, G. L. Transient thermoreflectance from thin metal films. J. Appl. Phys. 60, 285-290 (1986).
13. Young, D. A., Thomsen, C., Grahn, H. T., Maris, H. J. & Tauc, J. in Phonon Scattering in Condensed Matter(eds Anderson, A. C. & Wolfe, J. P.) 49 (Springer, Berlin, 1986).
14. Capinski, W. S. & Maris, H. J. Improved apparatus for picosecond pump-and-probe optical measurements. Rev. Sci. Instrum. 67, 2720-2726 (1996).
15. Capinski, W. S. et al. Thermal-conductivity measurements of GaAs/AlAs superlattices using a picosecond optical pump-and-probe technique. Phys. Rev. 559, 8105-8113 (1999).
16. Costescu, R. M., Wall, M. A. & Cahill, D. G. Thermal conductance of epitaxial interfaces. Phys. Rev. B 67, 054302 (2003).
17. Zhao, J.-C., Jackson, M. R. & Peluso, L. A. Mapping of the Nb-Ti-Si phase diagram using diffusion multiples. Mater. Sci. Eng. A 111, 111 (2003).
18. Powell, R. W. & Tye, R. P. The thermal and electrical conductivity of titanium and its alloys. J. Less-Common Metals 3, 226-233 (1961).
19. Verhoeven, H. et al. Influence of the microstructure on the thermal properties of thin polycrystalline diamond films. Appl. Phys. Lett. 71, 1329-1331 (1997).
20. O'Hara, K. E., Hu, X.-Y. & Cahill, D. G. Characterization of nanostructured metal films by picosecond acoustics and interferometry. J. Appl. Phys. 90, 4852-4858 (2001).