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Volumn 293, Issue 2, 2006, Pages 370-375

Combined annealing temperature and thickness effects on properties of PbZr0.53Ti0.47O3 films on LaNiO3/Si substrate by sol-gel process

Author keywords

A1. X ray diffraction; B1. Perovskite; B2. Ferroelectric materials

Indexed keywords

ANNEALING; DIELECTRIC PROPERTIES; FERROELECTRIC MATERIALS; LANTHANUM COMPOUNDS; PEROVSKITE; POROUS MATERIALS; THERMAL EFFECTS; THICK FILMS; X RAY DIFFRACTION;

EID: 33746768173     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2006.06.014     Document Type: Article
Times cited : (19)

References (19)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.