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Volumn 293, Issue 2, 2006, Pages 370-375
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Combined annealing temperature and thickness effects on properties of PbZr0.53Ti0.47O3 films on LaNiO3/Si substrate by sol-gel process
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Author keywords
A1. X ray diffraction; B1. Perovskite; B2. Ferroelectric materials
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Indexed keywords
ANNEALING;
DIELECTRIC PROPERTIES;
FERROELECTRIC MATERIALS;
LANTHANUM COMPOUNDS;
PEROVSKITE;
POROUS MATERIALS;
THERMAL EFFECTS;
THICK FILMS;
X RAY DIFFRACTION;
ANNEALING TEMPERATURE;
DENSER COLUMNAR STRUCTURE;
SINGLE PEROVSKITE-PHASE PZT FILMS;
LEAD COMPOUNDS;
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EID: 33746768173
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jcrysgro.2006.06.014 Document Type: Article |
Times cited : (19)
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References (19)
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