Thickness and erbium doping effects on the electrical properties of lead zirconate titanate thin films

Thin Solid Films

Volumn 440, Issue 1-2, 2003, Pages 26-34

  Es Souni, M ^a   Zhang, N ^a   Iakovlev, S ^a   Solterbeck, C H ^a   Piorra, A ^a  

^a UNIVERSITY OF APPLIED SCIENCES   (Germany)

Author keywords

Dielectric properties; Ferroelectric properties; Lead zirconate titanate; Leakage current

Indexed keywords

CAPACITANCE; DEPOSITION; DIELECTRIC FILMS; DOPING (ADDITIVES); ELECTRIC POTENTIAL; ERBIUM; FERROELECTRICITY; INTERFACES (MATERIALS); LEAKAGE CURRENTS; PERMITTIVITY; SOL-GELS; TEMPERATURE;

CAPACITANCE-VOLTAGE MEASUREMENTS;

LEAD COMPOUNDS;

EID: 0042122301     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(03)00814-9     Document Type: Article

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