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Volumn 12, Issue 2, 1997, Pages 444-456

Comments on the effects of solution precursor characteristics and thermal processing conditions on the crystallization behavior of sol-gel derived lead zirconate titanate thin films

Author keywords

[No Author keywords available]

Indexed keywords

CHELATION; COMPOSITION EFFECTS; CRYSTAL MICROSTRUCTURE; CRYSTALLIZATION; FOURIER TRANSFORM INFRARED SPECTROSCOPY; PYROLYSIS; SEMICONDUCTOR DEVICE MODELS; SILICON WAFERS; SOL-GELS; SOLUTIONS; SYNTHESIS (CHEMICAL); THIN FILMS;

EID: 0031078767     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/JMR.1997.0066     Document Type: Review
Times cited : (128)

References (31)
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    • Schwartz, R.W.1
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    • Schwartz, R.W.1    Assink, R.A.2    Headley, T.J.3
  • 20
    • 0029238056 scopus 로고
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  • 22
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    • 2. The width of the resonance was believed to be due to the distribution of pore sizes within the material
    • 2. The width of the resonance was believed to be due to the distribution of pore sizes within the material.
    • Haaland, D.M.1
  • 24
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    • Amorphous Insulating Thin Films, edited by J. Kanicki, W. L. Warren, R. A. B. Devine, and M. Matsumura Pittsburgh, PA
    • W-H. Shih and Q. Lu, in Amorphous Insulating Thin Films, edited by J. Kanicki, W. L. Warren, R. A. B. Devine, and M. Matsumura (Mater. Res. Soc. Symp. Proc. 284, Pittsburgh, PA, 1993), pp. 481-486.
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    • (1995) Mater. Res. Soc. Symp. Proc. , vol.361 , pp. 395-402
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.