Microstructure and electrical properties of Pb(Zr0.52Ti 0.48)O3 ferroelectric films on different bottom electrodes

Materials Letters

Volumn 58, Issue 27-28, 2004, Pages 3447-3450

  Jiankang, Li ^a   Xi, Yao ^a,b  

^a XI'AN JIAOTONG UNIVERSITY   (China)

^b TONGJI UNIVERSITY   (China)

Author keywords

Crystallization; Epitaxial films; LNO thin film; PZT thin film; Sol gel

Indexed keywords

CAPACITORS; CRYSTALLOGRAPHY; DIELECTRIC PROPERTIES; ELECTRIC POTENTIAL; ELECTRODES; LEAD COMPOUNDS; MATHEMATICAL MODELS; METALLORGANIC CHEMICAL VAPOR DEPOSITION; MICROSTRUCTURE; PEROVSKITE; POLARIZATION; SOL-GELS; THERMAL EFFECTS; X RAY DIFFRACTION;

COERCIVE FIELD; CRYSTALLOGRAPHIC DECOMPOSITION (MOD); PRECURSORS; ROOM TEMPERATURE;

FERROELECTRIC THIN FILMS;

EID: 4944239157     PISSN: 0167577X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matlet.2004.03.053     Document Type: Article

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