The grain size effect of the Pb(Zr0.45Ti0.55)O 3 thin films deposited on LaNiO3-coated silicon by modified sol-gel process

Journal of Crystal Growth

Volumn 260, Issue 1-2, 2004, Pages 109-114

  Hu, S H ^a   Hu, G J ^a   Meng, X J ^a   Wang, G S ^a   Sun, J L ^a   Guo, S L ^a   Chu, J H ^a   Dai, N ^a  

^a SHANGHAI INSTITUTE OF TECHNICAL PHYSICS   (China)

Author keywords

A1. X ray diffraction; B1. Perovskites; B2. Ferroelectric materials

Indexed keywords

FERROELECTRIC MATERIALS; GRAIN SIZE AND SHAPE; LANTHANUM COMPOUNDS; LEAD COMPOUNDS; PEROVSKITE; SOL-GELS; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

INFRARED SENSORS;

CRYSTAL GROWTH;

EID: 0242691938     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(03)01592-6     Document Type: Article

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