Preparation and characterization of multi-coating PZT thick films by sol-gel process

Journal of Crystal Growth

Volumn 264, Issue 1-3, 2004, Pages 307-311

  Hu, S H ^a   Meng, X J ^a   Wang, G S ^a   Sun, J L ^a   Li, D X ^b  

^a SHANGHAI INSTITUTE OF TECHNICAL PHYSICS   (China)

^b FUDAN UNIVERSITY   (China)

Author keywords

A1. X ray diffraction; A3. Polycrystalline deposition; B1. Perovskite; B2. Dielectric material; B2. Ferroelectric materials; B2. Nonlinear optical materials

Indexed keywords

ANNEALING; ELECTROMAGNETIC WAVE POLARIZATION; HELIUM NEON LASERS; PEROVSKITE; PIEZOELECTRIC MATERIALS; POLYCRYSTALLINE MATERIALS; SCANNING ELECTRON MICROSCOPY; SOL-GELS; X RAY DIFFRACTION ANALYSIS;

NONLINEAR OPTICAL MATERIALS; POLYCRYSTALLINE DEPOSITION;

CRYSTAL GROWTH;

EID: 1342327959     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2003.12.067     Document Type: Article

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