Application of magnetic force microscopy in nanomaterials characterization

Microscopy Research and Technique

Volumn 69, Issue 7, 2006, Pages 550-562

  De Lozanne, Alex ^a,b  

^a UNIVERSITY OF TEXAS AT AUSTIN   (United States)

^b The University of Texas at Austin   (United States)

Author keywords

Magnetic force microscopy; Magnetic materials; Nanostructures; Scanning probe microscopy

Indexed keywords

MAGNETIC FORCE MICROSCOPY; MAGNETIC MATERIALS;

'CURRENT; ALUMINIUM STRIP; COLOSSAL MAGNETORESISTANCE MATERIALS; CURRENTS DISTRIBUTIONS; MAGNETIC-FORCE MICROSCOPY; NANOMATERIALS CHARACTERIZATIONS; PATTERNED MAGNETIC MATERIAL; SCANNING-PROBE MICROSCOPY; TECHNICAL ASPECTS;

SCANNING PROBE MICROSCOPY;

ALUMINUM; BIOMATERIAL; NANOPARTICLE;

DATA ANALYSIS; IMAGE ANALYSIS; IMAGE DISPLAY; MAGNETIC FORCE MICROSCOPY; MEASUREMENT; MICROSCOPY; PRIORITY JOURNAL; REVIEW; SCANNING PROBE MICROSCOPY; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTOR; TECHNIQUE; TISSUE CHARACTERIZATION;

EID: 33746129566     PISSN: 1059910X     EISSN: 10970029     Source Type: Journal    
DOI: 10.1002/jemt.20325     Document Type: Review

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