Integrated piezoresistive sensors for atomic force-guided scanning Hall probe microscopy

Applied Physics Letters

Volumn 82, Issue 20, 2003, Pages 3538-3540

  Brook, A J ^a   Bending, S J ^a   Pinto, J ^a   Oral, A ^b   Ritchie, D ^c   Beere, H ^c   Henini, M ^d   Springthorpe, A ^e  

^a University of Bath   (United Kingdom)

^b BILKENT UNIVERSITY   (Turkey)

^c UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^d UNIVERSITY OF NOTTINGHAM   (United Kingdom)

^e NORTEL NETWORKS   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; HALL EFFECT; HETEROJUNCTIONS; MAGNETIC AMPLIFIERS;

MAGNETIC SENSORS;

SENSORS;

EID: 0037981462     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1576914     Document Type: Article

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