Mapping electron flow using magnetic force microscopy

Applied Physics Letters

Volumn 82, Issue 19, 2003, Pages 3287-3289

  Yongsunthon, R ^a   Stanishevsky, A ^a,c   Williams, E D ^a   Rous, P J ^b  

^a UNIVERSITY OF MARYLAND   (United States)

^b UNIVERSITY OF MARYLAND BALTIMORE COUNTY   (United States)

^c UNIVERSITY OF ALABAMA AT BIRMINGHAM   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; CHARGE TRANSFER; CURRENT DENSITY; DEFECTS; ELECTRIC CONDUCTORS; ELECTRIC CONTACTS; ION BEAMS; MICROSCOPIC EXAMINATION;

MAGNETIC FORCE MICROSCOPY (MFM);

IMAGING TECHNIQUES;

EID: 0038657590     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1573349     Document Type: Article

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