Submicron electrical current density imaging of embedded microstructures

Applied Physics Letters

Volumn 82, Issue 19, 2003, Pages 3272-3274

  Schrag, B D ^a   Xiao, Gang ^a  

^a BROWN UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT DENSITY; ELECTRIC CONDUCTORS; ELECTROMIGRATION; IMAGING TECHNIQUES; MAGNETIC FIELD EFFECTS; MAGNETORESISTANCE; MICROSCOPIC EXAMINATION; SENSORS;

SCANNING MAGNETIC MICROSCOPY;

ELECTRIC CURRENTS;

EID: 0038318843     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1570499     Document Type: Article

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