A method for the calibration of magnetic force microscopy tips

Journal of Applied Physics

Volumn 88, Issue 1, 2000, Pages 435-445

  Van Schendel, P J A ^a   Hug, H J ^a   Stiefel, B ^a   Martin, S ^a   Guntherodt H J ^a  

^a UNIVERSITY OF BASEL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000115266     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.373678     Document Type: Article

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