Practical SQUID instrument for nondestructive testing

Applied Physics Letters

Volumn 71, Issue 11, 1997, Pages 1573-1575

  Tralshawala, N ^a   Claycomb, J R ^a   Miller Jr , J H ^a  

^a UNIVERSITY OF HOUSTON   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM ALLOYS; CURRENT DENSITY; EDDY CURRENTS; FINITE ELEMENT METHOD; HIGH TEMPERATURE SUPERCONDUCTORS; IMAGING SYSTEMS; MAGNETOMETERS; NONDESTRUCTIVE EXAMINATION; PROBES; SUPERCONDUCTING TRANSITION TEMPERATURE;

EDDY CURRENT DENSITY; SCANNING EDDY CURRENT IMAGING SYSTEM;

SQUIDS;

EID: 0031572029     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.119974     Document Type: Article

References (5)

1. For a review of the use of SQUIDs for NDT, see J. P. Wikswo. Jr., IEEE Trans. Appl. Supercond. 5, 74 (1995).
2. N. Tralshawala, J. R. Claycomb, and J. H. Miller, IEEE Trans. Appl. Supercond. 7, 2890 (1997).
3. B. Wincheski, J. P. Fulton, S. Nath, M. Namkung, and J. W. Simpson, Mater. Eval. 52(1), 22 (1994).
4. iMAG system from Conductus Instruments and Systems Division. San Diego, CA 92121.
5. D. Ponnusamy, N. Tralshawala, J. R. Claycomb, J. H. Miller, Jr., K. Ravi-Chander, and K. Salama, IEEE Trans. Appl. Supercond. 7, 1418 (1997).