Localized measurement of penetration depth for a high Tc superconductor single crystal using a magnetic force microscope

Physica C: Superconductivity and its Applications

Volumn 371, Issue 2, 2002, Pages 146-150

  Lu, Qingyou ^a   Mochizuki, Koki ^a   Markert, John T ^a   De Lozanne, Alex ^a  

^a UNIVERSITY OF TEXAS AT AUSTIN   (United States)

Author keywords

Magnetic force microscopy; Penetration depth

Indexed keywords

ELECTRIC SHIELDING; HIGH TEMPERATURE SUPERCONDUCTORS; MAGNETIC FIELDS; MICROSCOPIC EXAMINATION; NATURAL FREQUENCIES; YTTRIUM BARIUM COPPER OXIDES;

MAGNETIC FORCE MICROSCOPES; SHIELDING CURRENTS;

SINGLE CRYSTALS;

EID: 0036604036     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4534(01)01067-X     Document Type: Article

References (17)