Self-compensating design for reduction of timing and leakage sensitivity to systematic pattern dependent variation

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6156, Issue , 2006, Pages

  Gupta, Puneet ^a   Kahng, Andrew B ^a   Kim, Youngmin ^b   Sylvester, Dennis ^b  

^a Blaze DfM   (United States)

^b University of Michigan   (United States)

Author keywords

ACLV; Focus; Leakage; Manufacturability; Self Compensating; Systematic; Variation

Indexed keywords

ACLV; LEAKAGE; MANUFACTURABILITY; SELF-COMPENSATING; SYSTEMATIC; VARIATION;

BENCHMARKING; FOCUSING; INTEGER PROGRAMMING; LINEAR PROGRAMMING; SENSITIVITY ANALYSIS;

OPTICAL DESIGN;

EID: 33745788792     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.659577     Document Type: Conference Paper

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