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Volumn 6151 II, Issue , 2006, Pages

Using phase mask algorithms to direct self assembly

Author keywords

BCP; Block copolymers; Directed Self Assembly; DSA; LER; Phase shifting lithography

Indexed keywords

DATA PARSING; DIRECTED SELF-ASSEMBLY (DSA); LER; PHASE-SHIFTING LITHOGRAPHY;

EID: 33745608943     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.666922     Document Type: Conference Paper
Times cited : (6)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.