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Volumn 8, Issue 1, 2006, Pages 13-19

Electrical properties of nanocrystalline silicon

Author keywords

Electrical transport; Nanocrystalline silicon; Quantum confinement

Indexed keywords

ACTIVATION ENERGY; CURRENT VOLTAGE CHARACTERISTICS; NANOCOMPOSITE FILMS; NANOCRYSTALS; POROUS SILICON; QUANTUM CHEMISTRY; QUANTUM CONFINEMENT; SEMICONDUCTOR QUANTUM WELLS; SILICA; SILICON OXIDES; TEMPERATURE DISTRIBUTION;

EID: 33646053829     PISSN: 14544164     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Conference Paper
Times cited : (10)

References (52)
  • 4
    • 0000227182 scopus 로고    scopus 로고
    • Properties of Porous Silicon
    • edited by L. T. Canham, INSPEC, London
    • "Properties of Porous Silicon" edited by L. T. Canham, EMIS Datareviews Series No. 18, INSPEC, London (1997).
    • (1997) EMIS Datareviews Series No. 18
  • 42
    • 0034452641 scopus 로고    scopus 로고
    • Int. Semicond. Conf. CAS 2000, Sinaia, October 2000
    • M. L. Ciurea, V. Iancu, Proc. IEEE CN 00TH8486, Int. Semicond. Conf. CAS 2000, Sinaia, October 2000, 1, 55 (2000).
    • (2000) Proc. IEEE CN 00TH8486 , vol.1 , pp. 55
    • Ciurea, M.L.1    Iancu, V.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.