Modeling of optical charging spectroscopy investigation of trapping phenomena in nanocrystalline porous silicon

Journal of Applied Physics

Volumn 94, Issue 1, 2003, Pages 216-223

  Iancu, Vladimir ^a   Ciurea, Magdalena Lidia ^b   Draghici, Mihai ^b  

^a UNIVERSITY POLITEHNICA OF BUCHAREST   (Romania)

^b NATIONAL INSTITUTE OF MATERIALS PHYSICS   (Romania)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENTS; ELECTRIC DISCHARGES; ELECTRON TRAPS; MATHEMATICAL MODELS; NANOSTRUCTURED MATERIALS; SPECTROSCOPY;

OPTICAL CHARGING SPECTROSCOPY;

POROUS SILICON;

EID: 0042842619     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1576301     Document Type: Article

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