Trapping levels in nanocrystalline porous silicon

Applied Physics Letters

Volumn 76, Issue 21, 2000, Pages 3067-3069

  Ciurea, M L ^a   Draghici M ^a   Lazanu, S ^a   Iancu, V ^b   Nassiopoulou, A ^c   Ioannou, V ^c   Tsakiri, V ^c  

^a NATIONAL INSTITUTE OF MATERIALS PHYSICS   (Romania)

^b UNIVERSITY POLITEHNICA OF BUCHAREST   (Romania)

^c INSTITUTE OF NANOSCIENCE AND NANOTECHNOLOGY   (Greece)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001344606     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.126581     Document Type: Article

References (15)

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