Oxidation-induced modifications of trap parameters in nanocrystalline porous silicon

Physica Status Solidi (A) Applied Research

Volumn 182, Issue 1, 2000, Pages 239-243

  Draghici, M ^a   Miu, M ^a   Iancu, V ^a   Nassiopoulou, A ^a   Kleps, I ^a   Angelescu, A ^a   Ciurea, M L ^a  

^a Natl Inst of Materials Physics   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVATION ENERGY; ANODIC OXIDATION; CHEMICAL BONDS; CHEMICAL MODIFICATION; NANOSTRUCTURED MATERIALS; SPECTROSCOPIC ANALYSIS; SURFACES;

OPTICAL CHARGING SPECTROSCOPY; TRAP PARAMETERS;

POROUS SILICON;

EID: 0034427336     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/1521-396X(200011)182:1<239::AID-PSSA239>3.0.CO;2-K     Document Type: Article

References (0)