-
6
-
-
0000132665
-
-
K. Murata, H. Kawata, K. Nagami, Y. Hirai, and Y. Mano, J. Vac. Sci. Technol. B 5, 124 (1987).
-
(1987)
J. Vac. Sci. Technol. B
, vol.5
, pp. 124
-
-
Murata, K.1
Kawata, H.2
Nagami, K.3
Hirai, Y.4
Mano, Y.5
-
7
-
-
0030283962
-
-
C. R. K. Marrian, F. K. Perkins, D. Park, E. A. Dobisz, M. C. Peckerar, K.-W. Rhee, and R. Bass, J. Vac. Sci. Technol. B 14, 3864 (1996).
-
(1996)
J. Vac. Sci. Technol. B
, vol.14
, pp. 3864
-
-
Marrian, C.R.K.1
Perkins, F.K.2
Park, D.3
Dobisz, E.A.4
Peckerar, M.C.5
Rhee, K.-W.6
Bass, R.7
-
8
-
-
0031654079
-
-
S.-H. Kim, Y.-M. Ham, W. Lee, and K. Chun, Microelectron. Eng. 41/42, 179 (1998).
-
(1998)
Microelectron. Eng.
, vol.41-42
, pp. 179
-
-
Kim, S.-H.1
Ham, Y.-M.2
Lee, W.3
Chun, K.4
-
9
-
-
0033269520
-
-
Y. Lee, J. W. Lee, K. Chun, and H. Kim, J. Vac. Sci. Technol. B 17, 2903 (1999).
-
(1999)
J. Vac. Sci. Technol. B
, vol.17
, pp. 2903
-
-
Lee, Y.1
Lee, J.W.2
Chun, K.3
Kim, H.4
-
10
-
-
0141791546
-
-
V. V. Ivin, M. V. Silakov, G. A. Babushkin, B. Lu, P. J. Mangat, K. J. Nordquist, and D. J. Resnik, Microelectron. Eng. 69, 594 (2003).
-
(2003)
Microelectron. Eng.
, vol.69
, pp. 594
-
-
Ivin, V.V.1
Silakov, M.V.2
Babushkin, G.A.3
Lu, B.4
Mangat, P.J.5
Nordquist, K.J.6
Resnik, D.J.7
-
12
-
-
0342833880
-
-
N. Glezos, I. Raptis, D. Tsoukalas, and M. Hatzakis, J. Vac. Sci. Technol. B 10, 2606 (1992).
-
(1992)
J. Vac. Sci. Technol. B
, vol.10
, pp. 2606
-
-
Glezos, N.1
Raptis, I.2
Tsoukalas, D.3
Hatzakis, M.4
-
16
-
-
0035875947
-
-
I. Raptis, N. Glezos, E. Valamontes, E. Zervas, and P. Argitis, Vacuum 62, 263 (2001).
-
(2001)
Vacuum
, vol.62
, pp. 263
-
-
Raptis, I.1
Glezos, N.2
Valamontes, E.3
Zervas, E.4
Argitis, P.5
-
19
-
-
0000800048
-
-
E. A. Dobisz, S. L. Brandow, R. Bass, and L. M. Shirey, J. Vac. Sci. Technol. B 16, 3695 (1998).
-
(1998)
J. Vac. Sci. Technol. B
, vol.16
, pp. 3695
-
-
Dobisz, E.A.1
Brandow, S.L.2
Bass, R.3
Shirey, L.M.4
-
21
-
-
0033697655
-
-
E. A. Dobisz, S. L. Brandow, R. Bass, and J. Mitterender, J. Vac. Sci. Technol. B 18, 107 (2000).
-
(2000)
J. Vac. Sci. Technol. B
, vol.18
, pp. 107
-
-
Dobisz, E.A.1
Brandow, S.L.2
Bass, R.3
Mitterender, J.4
-
23
-
-
4944228706
-
-
W. Hu, K. Sarveswaran, M. Lieberman, and G. H. Bernstein, J. Vac. Sci. Technol. B 22, 1711 (2004).
-
(2004)
J. Vac. Sci. Technol. B
, vol.22
, pp. 1711
-
-
Hu, W.1
Sarveswaran, K.2
Lieberman, M.3
Bernstein, G.H.4
-
33
-
-
15344342448
-
-
Z. Tan, Y. Xia, X. Liu, and M. Zhao, Microelectron. Eng. 77, 285 (2005).
-
(2005)
Microelectron. Eng.
, vol.77
, pp. 285
-
-
Tan, Z.1
Xia, Y.2
Liu, X.3
Zhao, M.4
-
37
-
-
0011403137
-
-
0021-8979 10.1063/1.342812
-
D. Liljequist, F. Salvat, R. Mayol, and J. D. Martinez, J. Appl. Phys. 0021-8979 10.1063/1.342812 65, 2431 (1989); D. Liljequist, F. Salvat, R. Mayol, and J. D. Martinez, J. Appl. Phys. 0021-8979 J. Appl. Phys. 66, 2768 (1989).
-
(1989)
J. Appl. Phys.
, vol.65
, pp. 2431
-
-
Liljequist, D.1
Salvat, F.2
Mayol, R.3
Martinez, J.D.4
-
38
-
-
33645528435
-
-
J. Appl. Phys. 0021-8979
-
D. Liljequist, F. Salvat, R. Mayol, and J. D. Martinez, J. Appl. Phys. 0021-8979 10.1063/1.342812 65, 2431 (1989); D. Liljequist, F. Salvat, R. Mayol, and J. D. Martinez, J. Appl. Phys. 0021-8979 J. Appl. Phys. 66, 2768 (1989).
-
(1989)
J. Appl. Phys.
, vol.66
, pp. 2768
-
-
Liljequist, D.1
Salvat, F.2
Mayol, R.3
Martinez, J.D.4
-
39
-
-
0003080101
-
-
A. Jablonski, J. Gryko, J. Kraaser, and S. Tougaard, Phys. Rev. B 39, 61 (1989).
-
(1989)
Phys. Rev. B
, vol.39
, pp. 61
-
-
Jablonski, A.1
Gryko, J.2
Kraaser, J.3
Tougaard, S.4
-
42
-
-
33645502581
-
-
To verify the total backscattering coefficient for Si substrate, we used the Monte Carlo program CASINO (http://www.gel.usherb.ca/casino).
-
-
-
-
43
-
-
0017463830
-
-
E. Gipstein, A. C. Ouano, D. E. Johnson, and O. U. Need III, IBM J. Res. Dev. 21, 143 (1977).
-
(1977)
IBM J. Res. Dev.
, vol.21
, pp. 143
-
-
Gipstein, E.1
Ouano, A.C.2
Johnson, D.E.3
Need Iii, O.U.4
-
44
-
-
34548642287
-
-
S. I. Stoliarov, P. R. Westmoreland, M. R. Nyden, and G. P. Forney, Adv. Polym. Sci. 44, 883 (2003).
-
(2003)
Adv. Polym. Sci.
, vol.44
, pp. 883
-
-
Stoliarov, S.I.1
Westmoreland, P.R.2
Nyden, M.R.3
Forney, G.P.4
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