Strong degradation of physical properties and formation of a dead layer in ferroelectric films due to interfacial dislocations

Integrated Ferroelectrics

Volumn 71, Issue , 2005, Pages 67-80

  Misirlioglu, I B ^a   Vasiliev, A L ^a   Aindow, M ^a   Alpay, S P ^a  

^a UNIVERSITY OF CONNECTICUT   (United States)

Author keywords

Dislocations; Ferroelectric thin films; Polarization; TEM; Thermodynamics

Indexed keywords

DISLOCATIONS; ELECTRICAL PROPERTIES; INTERFACIAL DISLOCATIONS; THERMODYNAMIC ANALYSIS;

CRYSTALLINE MATERIALS; DEGRADATION; ELECTRIC PROPERTIES; PHASE TRANSITIONS; POLARIZATION; THERMODYNAMICS; TRANSMISSION ELECTRON MICROSCOPY;

FERROELECTRIC THIN FILMS;

EID: 33644761864     PISSN: 10584587     EISSN: 16078489     Source Type: Conference Proceeding    
DOI: 10.1080/10584580590964709     Document Type: Conference Paper

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