Analysis of misfit relaxation in heteroepitaxial BaTiO3thin films

Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties

Volumn 79, Issue 10, 1999, Pages 2461-2483

  Suzuki, Toshimasa ^a   Nishi, Yuji ^a   Fujimoto, Masayuki ^a  

^a TAIYO YUDEN CO LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0040113484     PISSN: 01418610     EISSN: None     Source Type: Journal    
DOI: 10.1080/01418619908214294     Document Type: Article

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