Dielectric properties in heteroepitaxial Ba0.6Sr0.4TiO3 thin films: Effect of internal stresses and dislocation-type defects

Applied Physics Letters

Volumn 77, Issue 11, 2000, Pages 1695-1697

  Canedy, C L ^a   Li, Hao ^a   Alpay, S P ^a   Salamanca Riba, L ^a   Roytburd, A L ^a   Ramesh, R ^a  

^a UNIVERSITY OF MARYLAND   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000382682     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1308531     Document Type: Article

References (22)

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