Evolution of dislocation arrays in epitaxial BaTiO 3 thin films grown on (100) SrTiO 3

Applied Physics Letters

Volumn 84, Issue 17, 2004, Pages 3298-3300

  Sun, H P ^a   Tian, W ^a   Pan, X Q ^a   Haeni, J H ^b   Schlom, D G ^b  

^a UNIVERSITY OF MICHIGAN   (United States)

^b PENNSYLVANIA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DISLOCATION ARRAYS; EQUILIBRIUM CRITICAL THICKNESS; FERROELECTRIC PROPERTIES;

ENERGY DISPERSIVE SPECTROSCOPY; FERROELECTRIC MATERIALS; HIGH ENERGY ELECTRON DIFFRACTION; MOLECULAR BEAM EPITAXY; MOLECULAR DYNAMICS; NUCLEATION; STRONTIUM COMPOUNDS; SUBSTRATES; THICKNESS MEASUREMENT; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

BARIUM TITANATE;

EID: 2542484634     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1728300     Document Type: Article

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